Multifunctional scanning probe microscope NT-206
COUNTRY OF ORIGIN
IDENTIFIER
BO4541PUBLISHED
2021-12-10LAST UPDATE
2021-12-12DEADLINE
Linked profile in other language
Responsible
Svetlana Markova
+375 29 752 8328
sveta_oms@itmo.by
+375 29 752 8328
sveta_oms@itmo.by
Summary
A.V.Luikov Heat and Mass Transfer Institute offers consumers multifunctional scanning probe microscope NT-206 on the basis of a manufacturing agreement, is looking for partners to conclude an agreement on distribution services, as well as partners interested in purchasing technology for the production of the multifunctional scanning probe microscope NT-206 under a license agreement.
Description
Multifunctional scanning probe microscope (MSPM) NT-206 includes a measuring module and a control electronics unit.
The measuring module consists of a base platform and a measuring head installed on it. Provides measurement of a moving sample (maximum sample dimensions: Ø30 mm, height 8 mm) under a stationary probe.
The base platform provides for the installation of the probe, as well as placement and scanning of the sample. Includes a tubular piezoscanner XYZ-displacement of the test sample. Contains an automatic approach / retract system.
The XY-positioning platform provides automated movement of the measuring head relative to the stage in the XY plane within 10x10 mm (step up to 2.5 µm, visual control up to 10 µm). Manual positioning is possible.
The measuring head with a laser-beam system for detecting the deflection of the probe console supports operation in all modes (static and dynamic). Designed for the use of AFM probes (Si, SiN) on chips with a size of 3.6x1.4x0.6 mm, installed in a replaceable holder. The built-in video system enhances the convenience of monitoring and adjusting the probe when viewing the sample and positioning the probe. The size of the field of view of the video system is 1x0.75 mm, the size of the visualization window is 640x480 pixels, the frame rate is up to 30 fps.
Depending on the specifics of research tasks, MSPM NT-206 can be equipped with specialized replaceable modules for microtribometric and adhesion measurements or nanoindentation.
An image of a surface in an atomic force microscope is obtained by scanning a sample in a horizontal plane with a probe with a tip curvature radius of the order of 2..20 nanometers, which is fixed on a sensitive console. The control system monitors the position of the probe relative to the sample surface at each measured point and maintains the probe-to-sample distance at a constant specified level. Changes in the vertical position of the probe at each measurement point form a matrix of AFM data characterizing the relief and maps of surface properties, which is written to a file and used later for processing, visualization, and analysis of measurement results.
NT-206 allows conducting research in the following modes:
* Contact static AFM (display of relief, pressing force, lateral forces)
* Lateral force microscopy (in contact static AFM mode)
* Non-contact dynamic AFM
* Semi-contact dynamic AFM (analogue of Tapping Mode®, display of relief, phase shift, the amplitude of AFM probe oscillations)
* Phase contrast microscopy (in mixed dynamic AFM mode)
* Two-pass mode (for static and dynamic AFM)
* Two-pass mode with variable lift (for static and dynamic AFM)
* Multi-cycle area scanning (for static and dynamic AFM)
* Magnetic force microscopy (two-pass technique)
* Current mode
* Static force spectroscopy (with the calculation of quantitative characteristics, surface energy, and modulus of elasticity of the sample at the point of analysis)
* Dynamic amplitude-frequency force spectroscopy
* Nano-indentation, nano-scratching, nano-wear along the line
* Force nanolithography
* Temperature-dependent measurements (for all of the above modes).
MSPM can be used in research and industrial laboratories, as well as in the educational process in universities.
The measuring module consists of a base platform and a measuring head installed on it. Provides measurement of a moving sample (maximum sample dimensions: Ø30 mm, height 8 mm) under a stationary probe.
The base platform provides for the installation of the probe, as well as placement and scanning of the sample. Includes a tubular piezoscanner XYZ-displacement of the test sample. Contains an automatic approach / retract system.
The XY-positioning platform provides automated movement of the measuring head relative to the stage in the XY plane within 10x10 mm (step up to 2.5 µm, visual control up to 10 µm). Manual positioning is possible.
The measuring head with a laser-beam system for detecting the deflection of the probe console supports operation in all modes (static and dynamic). Designed for the use of AFM probes (Si, SiN) on chips with a size of 3.6x1.4x0.6 mm, installed in a replaceable holder. The built-in video system enhances the convenience of monitoring and adjusting the probe when viewing the sample and positioning the probe. The size of the field of view of the video system is 1x0.75 mm, the size of the visualization window is 640x480 pixels, the frame rate is up to 30 fps.
Depending on the specifics of research tasks, MSPM NT-206 can be equipped with specialized replaceable modules for microtribometric and adhesion measurements or nanoindentation.
An image of a surface in an atomic force microscope is obtained by scanning a sample in a horizontal plane with a probe with a tip curvature radius of the order of 2..20 nanometers, which is fixed on a sensitive console. The control system monitors the position of the probe relative to the sample surface at each measured point and maintains the probe-to-sample distance at a constant specified level. Changes in the vertical position of the probe at each measurement point form a matrix of AFM data characterizing the relief and maps of surface properties, which is written to a file and used later for processing, visualization, and analysis of measurement results.
NT-206 allows conducting research in the following modes:
* Contact static AFM (display of relief, pressing force, lateral forces)
* Lateral force microscopy (in contact static AFM mode)
* Non-contact dynamic AFM
* Semi-contact dynamic AFM (analogue of Tapping Mode®, display of relief, phase shift, the amplitude of AFM probe oscillations)
* Phase contrast microscopy (in mixed dynamic AFM mode)
* Two-pass mode (for static and dynamic AFM)
* Two-pass mode with variable lift (for static and dynamic AFM)
* Multi-cycle area scanning (for static and dynamic AFM)
* Magnetic force microscopy (two-pass technique)
* Current mode
* Static force spectroscopy (with the calculation of quantitative characteristics, surface energy, and modulus of elasticity of the sample at the point of analysis)
* Dynamic amplitude-frequency force spectroscopy
* Nano-indentation, nano-scratching, nano-wear along the line
* Force nanolithography
* Temperature-dependent measurements (for all of the above modes).
MSPM can be used in research and industrial laboratories, as well as in the educational process in universities.
Advantages and Innovations
The complex can compete with the most complex and expensive existing analytical instruments, provides the necessary accuracy and reproducibility of the analysis results at a much lower cost without presenting sufficiently high requirements to the qualifications of users.
Stage of development
Already on the market
Funding source
State budged
Internal
Internal
IPR status
Exclusive rights
Secret know-how
Secret know-how
Sector group
Aeronautics, Space and Dual-Use Technologies
Nano and micro technologies
Nano and micro technologies
Organization information
Type
R&D institution
Year established
1952
NACE keywords
D.35.30 - Steam and air conditioning supply
C.28.99 - Manufacture of other special-purpose machinery n.e.c.
M.72.19 - Other research and experimental development on natural sciences and engineering
M.74.90 - Other professional, scientific and technical activities n.e.c.
C.28.99 - Manufacture of other special-purpose machinery n.e.c.
M.72.19 - Other research and experimental development on natural sciences and engineering
M.74.90 - Other professional, scientific and technical activities n.e.c.
Turnover (in EUR)
20-50M
Already engaged in transnational cooperation
Yes
Additional comments
A.V.Luikov Heat and Mass Transfer Institute is the largest scientific institution in the republic dealing with the solution of fundamental and applied problems of heat and mass transfer, fluid dynamics, power engineering, heat engineering, chemical physics, physics of combustion and explosion, nanotechnology, as well as the creation of energy-efficient and environmentally friendly technologies and equipment, apparatus and devices for power engineering and mechanical engineering, agro-industrial complex and construction industry, medicine, chemical, electronic, radio engineering, food industry, space industry.
The Institute carries out scientific, scientific-organizational, and scientific-production interaction with academic and industrial research institutes, universities, design bureaus, associations, and enterprises of Belarus, Russia, Ukraine, Kazakhstan, Moldova, Uzbekistan, Lithuania, Latvia, China, USA, India, Germany, Poland , Czech Republic, Israel, Brazil, Italy, France, and other countries.
The Institute carries out scientific, scientific-organizational, and scientific-production interaction with academic and industrial research institutes, universities, design bureaus, associations, and enterprises of Belarus, Russia, Ukraine, Kazakhstan, Moldova, Uzbekistan, Lithuania, Latvia, China, USA, India, Germany, Poland , Czech Republic, Israel, Brazil, Italy, France, and other countries.
Languages spoken
English
Russian
Russian
Information about partnership
Type of partnership considered
Distribution services agreement
License agreement
Manufacturing agreement
License agreement
Manufacturing agreement
Type and role of partner sought
Customers interested in purchasing the multifunctional scanning probe microscope NT-206 under a manufacturing agreement.
Partners interested in concluding a distribution service agreement.
Partners interested in acquiring technology for the production of the multifunctional scanning probe microscope NT-206 under a license agreement.
Partners interested in concluding a distribution service agreement.
Partners interested in acquiring technology for the production of the multifunctional scanning probe microscope NT-206 under a license agreement.
Type and size of partner sought
> 500 MNE
> 500
251-500
SME 51-250
SME 11-50
SME <= 10
R&D Institution
University
> 500
251-500
SME 51-250
SME 11-50
SME <= 10
R&D Institution
University
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Статистика ведется с 11.12.2021 00:32:32
Статистика ведется с 11.12.2021 00:32:32