Multifunctional scanning probe microscope SSM-310
COUNTRY OF ORIGIN
BelarusIDENTIFIER
BO6649PUBLISHED
2023-04-23LAST UPDATE
2023-04-23DEADLINE
Linked profile in other language
Responsible
Svetlana Markova
+375 29 752 8328
sveta_oms@itmo.by
+375 29 752 8328
sveta_oms@itmo.by
Summary
A.V. Luikov Institute of Heat and Mass Transfer of the National Academy of Sciences of Belarus offers multifunctional scanning probe microscope SSM-310 under manufacturing agreement and is looking for partners to conclude distribution services agreement.
Description
A.V. Luikov Institute of Heat and Mass Transfer of the National Academy of Sciences of Belarus has developed a multifunctional scanning probe microscope (SPM) SSM-310, which includes a measuring module and a control electronics unit.
The measuring module consists of a base platform and a measuring head mounted on it. It allows measurement of a moving sample (maximum sample dimensions: Ø40 mm, height 13 mm) under a fixed probe. The base platform provides for the installation of the measuring head, as well as the placement and scanning of the sample. It includes a tubular piezoscanner XYZ-displacement of the test sample. Contains an automatic approach/retraction system. The XY-positioning platform provides automated movement of the measuring head relative to the object stage in the XY plane within 25x25 mm (step up to 2,5 µm, visual control up to 2,5 µm). Manual positioning is possible.
The measuring head with a laser-beam circuit for detecting the deflection of the probe arm supports operation in all modes (static and dynamic).
SSM-310 is designed for use with AFM probes (Si, SiN) on chips 3,6x1,4x0,6 mm in size, installed in a replaceable holder. The built-in video system makes it easier to control and adjust the probe when viewing the sample and positioning the probe. The size of the field of view of the video system is 120x120 µm, the size of the visualization window is 1980x1080 pixels, the frame rate is up to 30 fps. The magnification of the optical system is 6,5X at a focal length of 92 mm.
Depending on the specifics of the research tasks, the SPM SSM-310 can be equipped with specialized plug-in modules for microtribometric and adhesion measurements or nanoindentation.
MSPM SSM-310 allows conducting research in the following modes:
* Contact static AFM (display of relief, pressing force, lateral forces)
* Lateral force microscopy (in contact static AFM mode)
* Non-contact dynamic AFM
* Semi-contact dynamic AFM (analogue of Tapping Mode®, display of relief, phase shift, the amplitude of AFM probe oscillations)
* Phase contrast microscopy (in mixed dynamic AFM mode)
* Two-pass mode (for static and dynamic AFM)
* Two-pass mode with variable lift (for static and dynamic AFM)
* Multi-cycle area scanning (for static and dynamic AFM)
* Magnetic force microscopy (two-pass technique)
* Current mode
* Static force spectroscopy (with the calculation of quantitative characteristics, surface energy, and modulus of elasticity of the sample at the point of analysis)
* Dynamic amplitude-frequency force spectroscopy
* Nano-indentation, nano-scratching, nano-wear along the line
* Force nanolithography
* Temperature-dependent measurements (for all of the above modes).
Multifunctional scanning probe microscopes SSM-310 are used in the following areas: solid state physics, microelectronics, optics, thin-film technologies, nanotechnologies, semiconductor technologies, superhard materials, glasses and related technologies, micro- and nanotribology, surface finishing, polymers and composites on their basis, systems of precision mechanics, magnetic recording, vacuum technology, visualization of nanostructures, analysis of biological objects (membranes, cells, etc.).
The Institute offers potential partners to purchase the SSM-310 microscope under manufacturing agreement, and is also looking for interested parties to conclude a distribution services agreement.
The measuring module consists of a base platform and a measuring head mounted on it. It allows measurement of a moving sample (maximum sample dimensions: Ø40 mm, height 13 mm) under a fixed probe. The base platform provides for the installation of the measuring head, as well as the placement and scanning of the sample. It includes a tubular piezoscanner XYZ-displacement of the test sample. Contains an automatic approach/retraction system. The XY-positioning platform provides automated movement of the measuring head relative to the object stage in the XY plane within 25x25 mm (step up to 2,5 µm, visual control up to 2,5 µm). Manual positioning is possible.
The measuring head with a laser-beam circuit for detecting the deflection of the probe arm supports operation in all modes (static and dynamic).
SSM-310 is designed for use with AFM probes (Si, SiN) on chips 3,6x1,4x0,6 mm in size, installed in a replaceable holder. The built-in video system makes it easier to control and adjust the probe when viewing the sample and positioning the probe. The size of the field of view of the video system is 120x120 µm, the size of the visualization window is 1980x1080 pixels, the frame rate is up to 30 fps. The magnification of the optical system is 6,5X at a focal length of 92 mm.
Depending on the specifics of the research tasks, the SPM SSM-310 can be equipped with specialized plug-in modules for microtribometric and adhesion measurements or nanoindentation.
MSPM SSM-310 allows conducting research in the following modes:
* Contact static AFM (display of relief, pressing force, lateral forces)
* Lateral force microscopy (in contact static AFM mode)
* Non-contact dynamic AFM
* Semi-contact dynamic AFM (analogue of Tapping Mode®, display of relief, phase shift, the amplitude of AFM probe oscillations)
* Phase contrast microscopy (in mixed dynamic AFM mode)
* Two-pass mode (for static and dynamic AFM)
* Two-pass mode with variable lift (for static and dynamic AFM)
* Multi-cycle area scanning (for static and dynamic AFM)
* Magnetic force microscopy (two-pass technique)
* Current mode
* Static force spectroscopy (with the calculation of quantitative characteristics, surface energy, and modulus of elasticity of the sample at the point of analysis)
* Dynamic amplitude-frequency force spectroscopy
* Nano-indentation, nano-scratching, nano-wear along the line
* Force nanolithography
* Temperature-dependent measurements (for all of the above modes).
Multifunctional scanning probe microscopes SSM-310 are used in the following areas: solid state physics, microelectronics, optics, thin-film technologies, nanotechnologies, semiconductor technologies, superhard materials, glasses and related technologies, micro- and nanotribology, surface finishing, polymers and composites on their basis, systems of precision mechanics, magnetic recording, vacuum technology, visualization of nanostructures, analysis of biological objects (membranes, cells, etc.).
The Institute offers potential partners to purchase the SSM-310 microscope under manufacturing agreement, and is also looking for interested parties to conclude a distribution services agreement.
Advantages and Innovations
Multifunctional scanning probe microscope SSM-310 provides the necessary accuracy and reproducibility of results at a much lower cost than the more complex analytical instruments, and does not require high user qualification.
MSPM SSM-310 is compatible with third-party probes and external anti-vibration platforms.
MSPM SSM-310 is compatible with third-party probes and external anti-vibration platforms.
Stage of development
Already on the market
Funding source
State budged
Internal
Internal
IPR status
Exclusive rights
Secret know-how
Secret know-how
Sector group
Aeronautics, Space and Dual-Use Technologies
Nano and micro technologies
Nano and micro technologies
Organization information
Type
R&D institution
Year established
1952
NACE keywords
D.35.30 - Steam and air conditioning supply
C.28.99 - Manufacture of other special-purpose machinery n.e.c.
M.72.19 - Other research and experimental development on natural sciences and engineering
M.74.90 - Other professional, scientific and technical activities n.e.c.
C.28.99 - Manufacture of other special-purpose machinery n.e.c.
M.72.19 - Other research and experimental development on natural sciences and engineering
M.74.90 - Other professional, scientific and technical activities n.e.c.
Turnover (in EUR)
10-20M
Already engaged in transnational cooperation
Yes
Additional comments
A.V. Luikov Institute of Heat and Mass Transfer is the largest scientific institution in Belarus dealing with the solution of fundamental and applied problems of heat and mass transfer, fluid dynamics, power engineering, heat engineering, chemical physics, physics of combustion and explosion, nanotechnology, as well as the creation of energy-efficient and environmentally friendly technologies and equipment, apparatus and devices for power engineering and mechanical engineering, agro-industrial complex and construction industry, medicine, chemical, electronic, radio engineering, food industry, space industry.
The Institute carries out scientific, organizational, and production interaction with academic and industrial research institutes, universities, design bureaus, associations, and enterprises in Belarus, Russia, Ukraine, Kazakhstan, Moldova, Uzbekistan, Lithuania, Latvia, China, USA, India, Germany, Poland , Czech Republic, Israel, Brazil, Italy, France, and other countries.
The Institute carries out scientific, organizational, and production interaction with academic and industrial research institutes, universities, design bureaus, associations, and enterprises in Belarus, Russia, Ukraine, Kazakhstan, Moldova, Uzbekistan, Lithuania, Latvia, China, USA, India, Germany, Poland , Czech Republic, Israel, Brazil, Italy, France, and other countries.
Languages spoken
English
Russian
Russian
Information about partnership
Type of partnership considered
Distribution services agreement
Manufacturing agreement
Manufacturing agreement
Type and role of partner sought
Customers interested in purchasing the multifunctional scanning probe microscope SSM-310 under a manufacturing agreement.
Partners interested in concluding a distribution service agreement.
Partners interested in concluding a distribution service agreement.
Type and size of partner sought
> 500
251-500
SME 51-250
SME 11-50
SME <= 10
R&D Institution
University
251-500
SME 51-250
SME 11-50
SME <= 10
R&D Institution
University
Attachments
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Statistics since 23.04.2023 23:29:48
Statistics since 23.04.2023 23:29:48